Analysis of accelerated life methods of electronic components

Boštjan Tratar (2010) Analysis of accelerated life methods of electronic components. EngD thesis.

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Abstract

Trouble shooting and maximize the reliability of components are essential in creating a seamless product today. In this diploma thesis, I presented the accelerated life of electronic components, analysis methods and types of accelerated life tests. I have the purpose of tests and methods of accelerated life. As I noted, is the primary purpose of the tests determining the life of different products. Tests determined the proportion of failure of these products, wich we call the intensity of failure. I introduced species load, in order to achieve accelerated life, I also embakred on activation energy, degradation processes and make the case. When I clarified the concepts of aging and accelerated life, are coming tests and physical models of accelerated life. Stressed the essential features of the individual tests, given on the basis of these we can choose the right test chamber for the test. In physical models, I have devoted most attention Arrhenius, Coffin – Manson and Eyring models. Finally, I rounded the work in the section, where I did two examples of tests with the help of the specification test chamber Vötsch Industrietechnik namely model WVC C 600-70 VIT. In this series, I placed the chambers and the distribution of some major producers and providers of accelerated life tests.

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